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Prof. Jay Lee presents at NI Machine Condition Monitoring Webcast Series

by Wenyu — last modified 2011-02-16 13:25

Prof. Jay Lee will present "The Future of Condition Monitoring" in National Instrument Machine Condition Monitoring Webcast Series during February 22-24, 2011. To access the information and registration page, please visit:

http://zone.ni.com/devzone/cda/tut/p/id/12464?metc=mtmqud
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